Embedded system for examination based on artificial intelligence thereof
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The embedded system is disclosed. The system includes a management server, which controls the communication unit to transmit to the recording device and the lighting system and the communication section, an illumination system 2D image taking control signal and the 3D scanned image taking control signal lighting system at least one control signal of a performing communications a processor, and the processor is obtained by means of the at least one image to the communication unit of the 2D image and the 3D scanned image obtained from the image pickup apparatus on the basis of the light output by specimens in the illumination system according to the transmission control signal, and obtained deep learning the test recognition model from the management server, and, on the basis of the obtained deep learning the test recognition model and the acquired images to identify the presence of error in specimens.