메뉴
닫기


Image Classification Algorithm Using Unsupervised Deep learning and Self-Organizing Map
Year of publication
2018
Author
Jong Hyuk Lee, Ki Hoon Kwon, Jong Pil Yun, Min Young Kim
Conference
Institute of Control, Robotics and Systems 2018
Page
428-429

In recently, supervised learning is one of the most used artificial intelligence systems in the factory. But It takes a lot of time and manpower to classify each type of defect. In this paper, propose a clustering method using feature combining Autoencoder and Self-Organizing Map techniques. The experimental results show 60% clustering accuracy for MNIST dataset and 90% accuracy for fashion MNIST dataset.



[702-701] 1370 Sankyuk-dong, Buk-gu, Daegu, Korea
Tel : +82-53-950-7233 / Fax : +82-53-950-5505
Copyrights ⒞ 2019 Kyungpook National University. All Rights Reserved.